Ing. Miroslav KOL͡BAL, Ph.D. Publikační činnost

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1 Ing. Miroslav KOL͡BAL, Ph.D. Publikační činnost Původní vědecká práce ve vědeckém časopisu s impakt faktorem (IF) větším než 0.5 [A2.25] M. Kolíbal, L. Novák, T. Shanley, M. Toth,, T. Šikola: Silicon Oxide Nanowire Growth Mechanisms Revealed by Real-Time Electron Microscopy, Nanoscale 8 (2016), 266. (dx.doi.org/ /c5nr05152e) [A2.24] J. Mach, T. Šamořil, M. Kolíbal, J. Zlámal, S. Voborný, M. Bartošík, T. Šikola: Optimization of ion-atomic beam source for deposition of GaN ultrathin films, Rev. Sci. Instrum. 85 (2014), (dx.doi.org/ / ) [A2.23] Z. Druckmüllerová, M. Kolíbal, T. Vystavěl, T. Šikola: Towards site-specific dopant contrast in scanning electron microscopy, Microsc. Microanal. 20 (2014), (dx.doi.org// /s ) [A2.22] M. Kolíbal, T. Vystavěl, P. Varga, T. Šikola: Real time observation of collector droplet oscillations during growth of straight nanowires, Nano Lett. 14 (2014), (dx.doi.org/ /nl404159x) [A2.21] M. Kolíbal, M. Konečný, F. Ligmajer, D. Škoda, T. Vystavěl, J. Zlámal, P. Varga, T. Šikola: Guided Assembly of Gold Colloidal Nanoparticles on Silicon Substrates Prepatterned by Charged Particle Beams, ACS Nano 6(11), (2012), (dx.doi.org/ /nn ). [A2.20] M. Kolíbal, R. Kalousek, T. Vystavěl, L. Novák, T. Šikola, Controlled faceting in <110> germanium nanowire growth by switching between vapor-liquid-solid and vaporsolid-solid growth, Appl. Phys. Lett. 100 (2012), (dx.doi.org/ / ) [A2.19] M. Kolíbal, T. Vystavěl, L. Novák, J. Mach, T. Šikola: In-situ observation of <110> oriented Ge nanowire growth and associated collector droplet behavior, Appl. Phys. Lett. 99 (2011), (dx.doi.org/ / ) [A2.18] J. Mach, T. Šamořil, S. Voborný, M. Kolíbal, J. Zlámal, J. Spousta, L. Dittrichová, T. Šikola: An ultra-low energy ( ev) ion-atomic beam source for ion-beam-assisted deposition in ultrahigh vacuum, Rev. Sci. Instrum. 82 (2011), (dx.doi.org/ / ) [A2.17] M. Kolíbal, T. Matlocha, T. Vystavěl, T. Šikola: Low energy focused ion beam milling of silicon and germanium nanostructures, Nanotechnology, 22 (2011), (dx.doi.org/ / /22/10/105304) [A2.16] P. Bábor, R. Duda, S. Průša, T. Matlocha, M. Kolíbal, J. Čechal, M. Urbánek, T. Šikola: Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling, Nucl. Instrum. Methods Phys. Res., Sect. B 269 (2011), 369. (dx.doi.org/ /j.nimb )

2 [A2.15] T. Matlocha, S. Průša, M. Kolíbal, P. Bábor, D. Primetzhofer, S. N. Markin, P. Bauer, T. Šikola: A study of a LEIS azimuthal scan behavior: Classical dynamics simulation, Surf. Sci., 604 (2010), (dx.doi.org/ /j.susc ) [A2.14] J. Čechal, J. Polčák, M. Kolíbal, P. Bábor, T. Šikola: Formation of copper islands on a native SiO2 surface at elevated temperatures, Appl. Surf. Sci. 256 (2010), (dx.doi.org/ /j.apsusc ) [A2.13] M. Kolíbal, J. Čechal, M. Bartošík, J. Mach, T. Šikola: Stability of hydrogenterminated silicon surface under ambient atmosphere, Appl. Surf. Sci. 256 (2010), (dx.doi.org/ /j.apsusc ) [A2.12] M. Bartošík, M. Kolíbal, J. Čechal, J. Mach, T. Šikola: Selective growth of metallic nanostructures on surfaces patterned by AFM local anodic oxidation, J. Nanosci. Nanotechnology 9 (2009), (doi: /jnn ) [A2.11] J. Čechal, O. Tomanec, D. Škoda, K. Koňáková, T. Hrnčíř, J. Mach, M. Kolíbal, T. Šikola: Selective growth of Co islands on ion beam induced nucleation centers in a native SiO2 film, J. Appl. Phys. 105 (2009), (doi: / ) [A2.10] J. Čechal, T. Matlocha, J. Polčák, M. Kolíbal, O. Tomanec, R. Kalousek, P. Dub, T. Šikola: Characterization of oxidized gallium droplets on silicon surface: an ellipsoidal droplet shape model for angle resolved X-ray photoelectron spectroscopy analysis, Thin Solid Films 517 (2009), (doi: /j.tsf ) [A2.9] M. Kolíbal, T. Čechal, E. Brandejsová, J. Čechal, T. Šikola: Self-limiting cyclic growth of gallium droplets on Si(111), Nanotechnology 19 (2008), (doi: / /19/47/475606) [A2.8] J. Mach, J. Čechal, M. Kolíbal, M. Potoček, T. Šikola: Atomic hydrogen induced gallium nanocluster formation on the Si(100) surface, Surf. Sci. 602 (2008), (doi: /j.susc ) [A2.7] D. Primetzhofer, S. N. Markin, P. Zeppenfeld, P. Bauer, S. Průša, M. Kolíbal, T. Šikola: Quantitative analysis of ultrathin layer growth by time-of-flight low energy ion scattering, Appl. Phys. Lett. 92(1) (2008), (doi: / ) [A2.6] M. Kolíbal, O. Tomanec, S. Průša, M. Plojhar, S. N. Markin, L. Dittrichová, J. Spousta, P. Bauer, T. Šikola: TOF-LEIS spectra of Ga/Si: peak shape analysis, Nucl. Instrum. Methods Phys. Res., Sect. B 265(2) (2007), 569. [A2.5] J. Čechal, M. Kolíbal, P. Kostelník, T. Šikola: Gallium structure on the Si(111) (7 7) surface: influence of Ga coverage and temperature, J. Phys.: Condens. Matter 19 (2007), [A2.4] M. Kolíbal, S. Průša, M. Plojhar, P. Bábor, M. Potoček, O. Tomanec, P. Kostelník, S. N. Markin, P. Bauer, T. Šikola: In situ Analysis of Ga ultra Thin Films by ToF LEIS, Nucl. Instrum. Methods Phys. Res., Sect. B 249(1 2) (2006), 318.

3 [A2.3] M. Draxler, S. N. Markin, M. Kolíbal, S. Průša, T. Šikola, P. Bauer: High resolution time-of-flight low energy ion scattering, Nucl. Instrum. Methods Phys. Res., Sect. B 230 (2005), 398. [A2.2] M. Kolíbal, S. Průša, P. Bábor, T. Šikola: TOF-LEIS Analysis of Ultra Thin Films: Ga- and Ga-N Layer Growth on Si (111), Surf. Sci (2), (2004), 885. [A2.1] S. Voborný, M. Kolíbal, J. Mach, J. Čechal, P. Bábor, S. Průša, J. Spousta, T. Šikola: Deposition and in-situ characterization of ultra-thin films, Thin Solid Films 459(1 2) (2004), 17. Původní vědecká práce ve vědeckém časopisu s IF [A3.1] S. Průša, M. Kolíbal, P. Bábor, J. Mach, T. Šikola: Analysis of thin films by TOF- LEIS, Acta Phys. Pol. A 111(3) (2007), 335. Původní vědecká práce ve vědeckém časopisu s IF menším než nebo ve vědeckém časopisu bez IF [A4.5] F. Ligmajer, Z. Druckmüllerová, R. Měch, M. Kolíbal, T. Šikola: Tvorba uspořádaných souborů kovových nanočástic na polovodičových substrátech a jejich charakterizace pomocí spektroskopické elipsometrie, Jemná mechanika a optika 6-7 (2014), 178. [A4.4] P. Glajc, J. Zlámal, J. Mach, M. Kolíbal, T. Šikola: Návrh iontového zdroje se sedlovým polem a žhavenou katodou, Jemná mechanika a optika 6-7 (2014), 181. [A4.3] J. Mach, M. Potoček, M. Kolíbal, T. Šikola: Konstrukce a aplikace disociačního termálního zdroje atomů vodíku, Jemná mechanika a optika 55 (6) (2010), 163. [A4.2] P. Bábor, R. Duda, S. Průša, T. Matlocha, M. Kolíbal, R. Kalousek, J. Neuman, M. Urbánek, T. Šikola: Mechanika iontů jako prostředek k analýze nanosvěta, Jemná mechanika a optika 54 (7 8) (2009), 209. [A4.1] M. Kolíbal, S. Průša, P. Bábor, T. Šikola: Low energy ion scattering as a method for surface structure analysis, Jemná mechanika a optika 49(9) (2004), 262. Abstrakt ve sborníku světového nebo evropského kongresu, symposia, vědecké konference [A10.65] M. Kolíbal, T. Vystavěl, L. Novák, T. Pejchal, P. Varga, T. Šikola: Germanium nanowire growth in scanning electron microscope, invited talk at NWG 2015, October , Barcelona, Spain. Abstracts book/programme, p.3. [A10.64] T. Pejchal, M. Kolíbal, T. Šikola: The role of hydrogen in Ge nanowire growth, poster at NWG 2015, October , Barcelona, Spain. Abstracts book/posters, p.3.

4 [A10.63] M. Kolíbal, L. Novák, T. Vystavěl, T. Šikola: Real Time Observations of Nanowire Growth in Scanning Electron Microscope, oral presentation at the conference International Conference on Vacuum Science + Technology (ICN+T 2014), July 2014, Vail, Colorado,USA, Abstracts Book, MN-WeA4, 109. [A10.62] Z. Druckmüllerová, M. Kolíbal, T. Vystavěl, T. Šikola: Optimization of the sample preparation method for semiconductor dopant contrast observation with SEM, poster na 18th International Microscopy Congress, September 2014, Prague, Book of Abstracts T-13-P [A10.61] M. Kolíbal, T. Vystavěl, T. Šikola: Real time observations of collector droplet oscillations in scanning electron microscope. Poster na 18th International Microscopy Congress, September 2014, Prague, Book of Abstracts ID-12-P [A10.60] M. Kolíbal, L. Novák, T. Shanley, M. Toth, T. Šikola: In-situ observation of SiOx nanowire growth from Ga catalyst droplets. Poster na 8th Nanowire Growth Workshop, srpen 2014, Eindhoven, Book of abstracts P1-4. [A10.59] J. Mach, P. Mareš, T. Šamořil, P. Procházka, J. Hulva, J. Damková, M. Bartošík, S. Voborný, L. Břínek, Z. Édes, M. Kolíbal, J. Spousta, T. Šikola: Low Temperature Selective Growth of GaN Single Crystals on Pristine and Graphene Modified SiO 2 Substrates, poster presentation at the conference International Conference on Vacuum Science + Technology (ICN+T 2014), July 2014, Vail, Colorado, USA, Abstracts Book, NM-MoP7, 78. [A10.58] Z. Druckmüllerová, F. Ligmajer, M. Kolíbal, T. Šikola: Adhesion of gold colloidal nanoparticles on GaAs substrate, poster presentation at the conference Joint vacuum conference (JVC 15), June 2014, Wien, Austria, Book of abstracts, 131. [A10.57] M. Kolíbal, T. Vystavěl, T. Šikola: Collector droplet instability during PVD germanium nanowire growth. Poster na 7th Nanowire Growth Workshop, červen 2013, Lausanne, Book of abstracts P36. [A10.56] Z. Druckmüllerová, F. Ligmajer, M. Kolíbal, M. Šimšíková, P. Varga, T. Šikola: 2D assembly of colloidal nanoparticles on semiconductor substrates pre-patterned by charged particle beams, oral presentation NST-4-Or-3 at IVC-19 and ICN+T International Conference on Nanoscience and Nanotechnology, September 2013, Paris, France ( [A10.55] J. Mach, T. Šamořil, S. Voborný, M. Kolíbal, P. Mareš, J. Hulva, T. Šikola: Selective growth of GaN single crystals at ion-beam-induced nucleation centers on SiO 2 surface at low deposition temperatures, poster presentation at ICN+T 2012, Paris (France), July 2012, Program PO9.26, p [A10.54] M. Kolíbal, J. Čechal, M. Bartošík, J. Mach, T. Šamořil, S. Voborný, L. Dittrichová, R. Kalousek, J. Spousta, T. Šikola: Selective growth of nanostructures nucleation on prepaterned surfaces, oral presentation at ICN+T 2012, Paris (France), July 2012, Program SO2.3, p. 104.

5 [A10.53] T. Vystavěl, L. Novák, P. Wandrol; M. Kolíbal, J. Mach, T. Šikola: In-Situ SEM Observation of Oriented Ge Nanowire Growth, oral presentation at Microscopy & Microanalysis 2012, Phoenix (USA), July 2012,Conference programme A-15, no [A10.52] P. Bábor, R. Duda, S. Průša, T. Matlocha, M. Kolíbal, T. Šikola: Combined DSIMS and TOF-LEIS profiling, poster presentation at SIMS XVIII, September 2011, Riva del Garda (Italy), Program book, Thu-pos-6. [A10.51] M. Kolíbal, J. Čechal, M. Bartošík, J. Mach, T. Šamořil, O. Tomanec, S. Voborný, J. Zlámal, R. Kalousek, J. Spousta, T. Šikola: Selective growth of nanostructures principles of atomic nucleation at pre-patterned surfaces, oral presentation at 15th International Conference on Thin Films (ICTF15), Kyoto (Japan), November 2011, Final program O-S7-10. [A10.50] J. Mach, J. Polčák, T. Šamořil, M. Kolíbal, S. Voborný, T. Šikola: Preparation of GaN shelled droplets with a Ga core on the Si (111) surface, poster presentation at 15th International Conference on Thin Films (ICTF15), Kyoto (Japan), November 2011, Final program P-S12-0. [A10.49] M. Konečný, M. Bartošík, M. Kolíbal, D. Škoda, R. Kalousek, J. Mach, J. Spousta, and T. Šikola, Aplication of Kelvin Probe Force Microscopyin detection of surface charging, poster presentation at ICFSI 13, Prague, Book of Abstracts, no [A10.48] M. Bartošík, D. Škoda, Z. Bortlová, R. Kalousek, M. Rudolf, M. Kolíbal, J. Spousta, T. Šikola: The experimental and simulation study of water condensation between the AFM-tip and Si/SiO 2 surfaces, poter presentation at the European Konference on Surface Science (ECOSS 28), Wroclaw (Poland), August/September 2011, Program & Abstracts, LIQ- 04, p [A10.47] M. Kolíbal, T. Vystavěl, L. Novák, J. Mach, T. Šikola: In-situ Observation of <110> Oriented Ge Nanowire Growth And Associated Collector Droplet Behavior, oral presentation at 15th International Conference on Thin Films (ICTF15), Kyoto (Japan), November 2011, Final program, O-S7-02, p. 36. [A10.46] M. Kolíbal, F. Ligmajer, D. Škoda, J. Zlámal, T. Vystavěl, T. Šikola: Two dimensional assembly of gold colloids using focused ion beam, poster presentation at 37th International Conference on Micro and Nano Engineering (MNE2011), Berlin (Germany), September 2011, Technical program, P-LITH-136. [A10.45] J. Mach, T. Šamořil, S. Voborný, P. Bábor, J. Čechal, M. Kolíbal, M. Potoček, T. Šikola: Ion-Atom Beam Source and Its Application for Preparation of Ultrathin Films, poster presentation at Europian conference on Surface Science (ECOSS27), Groningen (The Netherlands), August-September 2010, Program book, SS-MO-p056, p [A10.44] M. Kolíbal, J. Mach, A. Seregin, D. Škoda, T. Šikola: Initial stages of germanium nanowires grown by thermal evaporation, poster presentation at Europian conference on Surface Science (ECOSS27), Groningen (The Netherlands), August-September 2010, Program book, SDG-MO-p015, page 187.

6 [A10.43] M. Potoček, P. Bábor, M. Kolíbal, D. Škoda, M. Bartošík, J. Zlámal, L. Dittrichová, T. Šikola: Subsurface diffusion of Ga: Its influence on a desorption process at Si surfaces, poster presentation at European Conference on Surface Science (ECOSS 27), Groningen (The Netherlands), August-September 2010, Program book, SDG-MO-p018, p [A10.42] T. Matlocha, S. Průša, M. Kolíbal, P. Bábor, J. Spousta, T. Šikola: A study of nanostructures morphology by low energy ion scattering, poster presentation at European Conference on Surface Science 2010 (ECOSS27), Groningen (The Netherlands), July/August 2010, Program book, SDG-MO-p016, p [A10.41] P. Bábor, R. Duda, S. Průša, T. Matlocha, M. Kolíbal, M. Urbánek, T. Šikola: Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling, oral presentation at European Conference on Surface Science 2010 (ECOSS27), Groningen (The Netherlands), July/August 2010, Program book, UTS-M1-008, p. 35. [A10.40] Jindřich Mach, M. Kolíbal, J. Čechal, T. Šamořil, S. Voborný, J. Spousta, T. Šikola: Selective growth of GaN nanodots on ion beam induced nucleation centers on Si(111), oral presentation at International Vacuum Congress (IVC18), Beijing (China), August 2010, Program book, NST8-O-5, p [A10.39] P. Bábor, R. Duda, S. Průša, T. Matlocha, M. Kolíbal, M. Urbánek, J. Sobota, T. Šikola: Combined DSIMS and TOF-LEIS depth profilling and the coinciding sample spot, Poster presentation at the conference European 19th International Conference on Ion Beam Analysis, Cambridge (United Kingdom), September 2009, Abstract book, Tu-062, p [A10.38] T. Matlocha, M. Kolíbal, S. Průša, P. Bábor, R. Duda, J. Spousta, T. Šikola: A study of surface-island morphology by low energy ion scattering, Poster presentation at the conference European 19th International Conference on Ion Beam Analysis, Cambridge (United Kingdom), September 2009, Abstract book, Th-088, p [A10.37] L. Břínek, M. Kolíbal, P. Dvořák, E. Schmidt, L. Šustr, R. Kalousek, J. Zlámal, P. Dub, T. Šikola: Surface plasmon resonances at gallium droplets, Poster presentation at the conference European Conference on Surface Science ECOSS 26, Parma (Italy), August- September 2009, Programme, We-ELO-P-084, p [A10.36] M. Kolíbal, J. Mach, S. Průša, M. Potoček, J. Spousta, T. Vystavěl, T. Šikola: Gallium droplet arrays for nanowire fabrication, Poster presentation at the conference European Conference on Surface Science ECOSS 26, Parma (Italy), August-September 2009, Programme, Mo-CLU-P-085, p [A10.35] M. Potoček, P. Bábor, M. Kolíbal, D. Škoda, M. Bartošík, J. Zlámal, L. Dittrichová, T. Šikola: Processes on Si surfaces during Ga evaporation, desorption and subsurface diffusion of Ga, Poster presentation at the conference European Conference on Surface Science ECOSS 26, Parma (Italy), August-September 2009, Programme, We-DIF-P-054, p [A10.34] M. Kolíbal, M. Bartošík, J. Mach, J. Čechal, D. Škoda, T. Šikola: Laterally-ordered growth of gallium droplets on silicon substrates, Poster presentation at the conference EuroNanoForum 2009, Praha, June 2009, Programme, P-139, p. 179.

7 [A10.33] J. Čechal, O. Tomanec, D. Škoda, J. Polčák, M. Kolíbal, T. Šikola: Guided growth of metallic nanostructures on the native SiO 2 locally modified by focussed ion beam, Poster presentation at the conference EuroNanoForum 2009, Praha, June 2009, Programme, P-140, p [A10.32] T. Matlocha, M. Kolíbal, S. Průša, P. Bábor, S. N. Markin, D. Primetzhofer, P. Bauer, T. Šikola: The study of the LEIS angular scan behaviour: Molecular dynamics simulation, Poster presentation at the conference 12th Joint Vacuum Conference (JVC-12), Balatonalmádi (Hungary), September 2008, Conference Programme, P-10, p [A10.31] M. Potoček, P. Bábor, S. Voborný, M. Kolíbal, L. Dittrichová, J. Spousta, T. Šikola: Detection of fluorocarbons after HF etching of Si(100) wafer, Poster presentation at the conference 12th Joint Vacuum Conference (JVC-12), Balatonalmádi (Hungary), September 2008, Conference Programme, P-127, p [A10.30] J. Mach, S. Voborný, M. Kolíbal, P. Bábor, M. Potoček, J. Čechal, T. Šikola: Ion- Atom beam source and its application for preparation of ultrathin films, Poster presentation at the conference 14th International Conference on Solid Films and Surfaces (ICSFS14), Dublin (Ireland), June/July 2008, Programme, Tue-P-42, p [A10.29] P. Bábor, S. Průša, R. Duda, M. Urbánek, M. Kolíbal, V. Uhlíř, T. Šikola: Parallel depth profilling of GMR multilayers by DSIMS and TOF-LEIS, Poster presentation at the conference 14th International Conference on Solid Films and Surfaces (ICSFS14), Dublin (Ireland), June/July 2008, Programme, Tue-P-56, p [A10.28] M. Bartošík, M. Kolíbal, J. Čechal, J. Mach, M. Urbánek, O. Tomanec, J. Spousta, P. Klapetek, T. Šikola: Selective Growth and Testing of Metal Nanostructures, Oral presentation at the conference International Conference on Nanoscience + Technology (ICN+T 2008), Keystone (Colorado, USA), July 2008, Technical Program & Abstracts, NO2- TuA10, p [A10.27] O. Tomanec, J. Čechal, J. Mach, M. Kolíbal, K. Koňáková, T. Němeček, D. Škoda, M. Bartošík, T. Hrnčíř, T. Šikola: Selective Growth and Testing of Metal Nanostructures, Oral presentation at the conference International Conference on Nanoscience + Technology (ICN+T 2008), Keystone (Colorado, USA), July 2008, Technical Program & Abstracts, NO1- TuM13, suplement. [A10.26] O. Tomanec, J. Čechal, J. Mach, M. Kolíbal, K. Koňáková, T. Němeček, D. Škoda, M. Bartošík, T. Hrnčíř, T. Šikola: Selective Growth and Testing of Metal Nanostructures, Poster presentation at the conference International Conference on Nanoscience + Technology (ICN+T 2008), Keystone (Colorado, USA), July 2008, Technical Program & Abstracts, NO- TuP3, p [A10.25] M. Urbánek, T. Matlocha, P. Bábor, R. Duda, M. Kolíbal, J. Spousta, T. Šikola: Influence of scattered primary ions on the interlayer mixing of multilaers grown by ion beam sputtering, Poster presentation at the conference 14th International Conference on Solid Films and Surfaces (ICSFS14), Dublin (Ireland), June/July 2008, Programme, Tue-P-7, p [A10.24] M. Kolíbal, T. Čechal, J. Čechal, E. Brandejsová, O. Tomanec, M. Bartošík, J. Spousta, T. Šikola: Self-limiting cyclic growth of gallium droplets on Si(111), Oral

8 presentation at the conference 14th International Conference on Solid Films and Surfaces (ICSFS14), Dublin (Ireland), June/July 2008, Programme, Tue-CL-22, p. 99. [A10.23] S. Průša, P. Bábor, M. Kolíbal, V. Uhlíř, T. Šikola: Combined TOF-LEIS and SIMS techniques, Oral presentation at the conference 14th International Conference on Solid Films and Surfaces (ICSFS14), Dublin (Ireland), June/July 2008, Programme, Fri-CL-8, p [A10.22] P. Bauer, D. Primetzhofer, S. Průša, M. Kolíbal, S. N. Markin, T. Šikola, P. Zeppenfeld: Growth of Au on B/Si: a quantitative ToF LEIS analysis, Poster presentation at the conference Symposium on Surface Science 2008 (3S 08), St. Christoph am Arlberg (Austria), March 2008, Contributions (ed. by F. Aumayer and P. Varga), p. 69. [A10.21] M. Bartošík, M. Kolíbal, J. Mach, J. Luksch, J. Čechal, R. Kalousek, J. Spousta, T. Šikola: Fabrication of nanostructures by selective growth, Poster presentation at the conference Symposium on Surface Science 2008 (3S 08), St. Christoph am Arlberg (Austria), March 2008, Contributions (ed. by F. Aumayer and P. Varga), p [A10.20] T. Matlocha, M. Kolíbal, O. Tomanec, S. Průša, J. Spousta, T. Šikola: The low energy He + ion scattering on silicon and Ga/Si(111) surfaces: molecular dynamics simulation, Poster presentation at the conference 6th International Conference on Nanosciences and Nanotechnologies (Nano 07), Brno, October 2007, Abstract Booklet, p. 77. [A10.19] J. Mach, M. Kolíbal, J. Čechal, M. Potoček, T. Šikola: The design and application of hydrogen atom beam source for cleaning and modification of surfaces and ultrathin films, Poster presentation at the conference 6th International Conference on Nanosciences and Nanotechnologies (Nano 07), Brno, October 2007, Abstract Booklet, p. 74. [A10.18] J. Čechal, J. Mach, M. Kolíbal, P. Kostelník, M. Potoček, S. Voborný, P. Bábor, J. Spousta, T. Šikola: Gallium Structure on Silicon Surfaces Studied by Synchrotron Radiation Photoelectron Spectroscopy, Poster presentation at the conference Synchrotron Facilities for the Development of Science and Technology in Central and Eastern Europe, Brno, November 2007, Book of Abstracts, p. 16. [A10.17] M. Kolíbal, J. Čechal, M. Bartošík, J. Mach, T. Šikola: Stability of hydrogenterminated silicon surface under ambient atmosphere, Poster presentation at the conference 6th International Conference on Nanosciences and Nanotechnologies (Nano 07), Brno, October 2007, Abstract Booklet, p. 70. [A10.16] J. Čechal, M. Kolíbal, J. Mach, M. Potoček, T. Šikola: Oxidation of gallium droplets on Si(111): an XPS study, Poster presentation at the conference ECASIA 07, Brussels, September 2007, Book of Abstracts and Final Programme, OXD-1404, p [A10.15] J. Mach, M. Kolíbal, J. Čechal, S. Voborný, T. Šikola: Analysis of GaN ultrathin hilms grown by ion-atom beam source, Poster presentation at the conference 17th Internationl Vacuum Congress (IVC-17), Stockholm, July 2007, Final Programme, TFSEP3-200, p [A10.14] S. Průša, M. Kolíbal, J. Čechal, P. Bábor, J. Luksch, M. Plojhar, J. Spousta, M. Urbánek, M. Havlíček, T. Šikola: Low energy ion scattering on Co/Si(111) system, Poster presentation at the conference 17th Internationl Vacuum Congress (IVC-17), Stockholm, July 2007, Final Programme, ASSP3-40, p. 139.

9 [A10.13] P. Bábor, M. Potoček, S. Voborný, J. Polčák, S. Průša, M. Kolíbal, J. Spousta, L. Dittrichová, J. Sobota, Z. Bochníček, R. Roučka, J. Kouvetakis, T. Šikola: Depth profiling of Mo/Si multi-nano-layers by DSIMS and HRTEM, Poster presentation at the conference 17th Internationl Vacuum Congress (IVC-17), Stockholm, July 2007, Final Programme, ASSP3-26, p [A10.12] E. Brandejsová, A. Nebojsa, M. Kolíbal, M. Urbánek, J. Čechal, M. Potoček, J. Spousta, T. Šikola: In Situ Analysis of Ga Ultrathin Films on Si(111) Substrates, Poster presentation at the conference Joint Vacuum Conference JVC 11, Prague, September 2006, Book of Abstracts, PM39, p. 91. [A10.11] M. Kolíbal, S. Průša, O. Tomanec, D. Škoda, M. Potoček, J. Mach, J. Čechal, P. Kostelník, M. Plojhar, T. Matlocha, P. Bábor, S. Voborný, J. Spousta, S. Markin, P. Bauer, T. Šikola: The effect of temperature and low energy ion bombardment on the growth modes of Ga ultrathin films on Si(111) substrates studied by ToF LEIS, AFM/STM and LEED, Poster presentation at the conference European Conference on Surface Science ECOSS 24, Paris, September 2006, Final programme, CLU Th P 468, p [A10.10] J. Čechal, P. Bábor, S. Voborný, J. Mach, M. Kolíbal, P. Kostelník, S. Průša, J. Spousta, T. Šikola: A study of gallium growth on silicon substrates by SR PES, Poster presentation at the conference European Conference on Surface Science ECOSS 24, Paris, September 2006, Final programme, CLU Th P 426, p [A10.9] O. Tomanec, M. Bartošík, D. Škoda, R. Kalousek, M. Kolíbal, J. Neuwirth, M. Urbánek, S. Voborný, L. Lovicar, R. Chmelík, J. Spousta, T. Šikola: Fabrication of Metallic Nanostructures by Local Anodic Oxidation for Surface Plasmon Polariton Studies, Poster presentation at the conference International Conference on Nanoscience and Technology 2006, Basel, July/August 2006, Final program, P1237, p [A10.8] M. Bartošík, O. Tomanec, M. Kolíbal, J. Mach, S. Voborný, R. Kalousek, J. Spousta, A. Fejfar, T. Šikola: Fabrication of Nanostructures by Selective Growth of Ga on Surfaces Patterned by AMF, Poster presentation at the conference International Conference on Nanoscience and Technology 2006, Basel, July/August 2006, Abstrakt Book, P1151, p [A10.7] M. Kolíbal, S. Průša, M. Plojhar, P. Bábor, M. Potoček, O. Tomanec, S. N. Markin, P. Bauer, T. Šikola: In situ Analysis of Ga-ultra Thin Films by TOF-LEIS, Oral presentation at the 17 th Conference on Ion Beam Analysis (IBA 17), Sevilla, June/July 2005, Book of Abstracts, Abstract No. 176 (Tue B 17:50). [A10.6] M. Kolíbal, S. Průša, O. Tomanec, M. Potoček, J. Čechal, P. Kostelník, M. Plojhar, P. Bábor, J. Spousta, S. N. Markin, P. Bauer, T. Šikola: Application of ToF LEIS for Monitoring the growth and thermal treatment of Ga ultrathin films, Poster presentation at the conference ECASIA 05, Vienna, September 2005, Book of Abstracts, Abstract No. Tue TFI 31, p [A10.5] S. Voborný, J. Čechal, P. Bábor, J. Mach, M. Kolíbal, O. Tomanec, J. Spousta, T. Šikola: Deposition and analysis of GaN-ultrathin films, Oral presentation at the 16 th International Vacuum Congress (IVC 16), Venice, June/July 2004, Book of Abstracts, Abstract No. TF TuA8, p. 223.

10 [A10.4] M. Kolíbal, S. Průša, P. Bábor, P. Kostelník, P. Bauer, T. Šikola: Characterisation of ultra thin gallium layers on silicon substrates by TOF LEIS, AFM/STM and LEED, Oral presentation at the 16 th International Vacuum Congress (IVC 16), Venice, June/July 2004, Book of Abstracts, Abstract No. TF TuA4, p [A10.3] M. Kolíbal, S. Průša, P. Bábor, T. Šikola: ToF-LEIS analysis of ultra thin films: Gaand Ga-N layer growth on Si (111), Poster presentation at the 22nd European Conference on Surface Science (ECOSS 22), Praha, September [A10.2] S. Průša, M. Kolíbal, P. Bábor, J. Mach, P. Jurkovič, and T. Šikola: Analysis of thin films by ToF LEIS, Poster presentation at the European Vacuum Congress (EVC 03), Berlin, June 2003, Abstracs, p [A10.1] S. Voborný, M. Kolíbal, J. Mach, J. Čechal, P. Bábor, S. Průša, J. Spousta, T. Šikola: Deposition and in situ characterization of ultra-thin films, Oral presentation at the European Vacuum Congress (EVC 03), Berlin, June 2003, Abstracs, p Příspěvek ve sborníku národního nebo mezinárodního kongresu, symposia, vědecké konference [A11.5] M. Kolíbal: Úvod do analýzy povrchů, Zpravodaj ČVS 22 (2012), 2. [A11.4] M. Bartošík, M. Kolíbal, J. Čechal, J. Mach, J. Spousta, T. Šikola: Selektivní růst nanostruktur, Zpravodaj ČVS 20 (2012), 9. [A11.3] M. Kolíbal, M. Urbánek, O. Tomanec, T. Matlocha, V. Uhlíř, P. Bábor, E. Kolíbalová, T. Hrnčíř, T. Vystavěl, J. Spousta, T, Šikola: Aplikace fokusovaného iontového svazku (FIB) k přípravě a funkcionalizaci nanostruktur, Zpravodaj ČVS 20 (2012), 18. [A11.2] M. Kolíbal, S. Průša, P. Bábor, M. Bartošík, O. Tomanec, M. Draxler, P. Bauer, T. Šikola: Growth of gallium on silicon: A ToF-LEIS and AFM study, Proceedings of the conference New Trends in Physics, VUT v Brně, Brno 2004, 230. [A11.1] S. Voborný, J. Mach, M. Kolíbal, J. Čechal, P. Bábor, M. Potoček, T. Šikola: A Study of Early Periods of GaN Ultrathin Growth, Proceedings of the conference New Trends in Physics, VUT v Brně, Brno 2004, 270. Abstrakt ve sborníku národního nebo mezinárodního kongresu, symposia, vědecké konference, příspěvek ve sborníku odborné konference [A13.5] M. Kolíbal, T. Pejchal, J. Mach, R. Kalousek, L. Novák, T. Vystavěl, T. Šikola: Realtime observations of germanium nanowire growth in scanning electron microscope, zvaná přednáška na konferenci Mikroskopie 2016, květen 2016, Lednice, ČR (Program str. 26, OI- IN-1011).

11 [A13.4] M. Kolíbal: Úvod do analýzy povrchů, zvaná přednáška na Letní škole vakuové fyziky, květen 2014, hotel Luna, Vysočina, ČR. [A13.3] M. Kolíbal: Aplikace fokusovaného iontového svazku (FIB) k přípravě a funkcionalizaci nanostruktur, zvaná přednáška na Letní škole vakuové fyziky, květen 2012, Jizerka/Polubný, ČR. [A13.2] M. Kolíbal: Watching nanowires grow, přednáška na konferenci Microscopy 2011, Nové Město na Moravě, February [A13.1] M. Kolíbal, J. Mach, T. Vystavěl, T. Šikola: Patterned growth of catalytic nanoparticles utilizing focused ion beam, přednáška na konferenci Mikroskopie 2010, Nové Město na Moravě, Únor 2009, Program, Přednášky-7, p. 15.